| 加工定制 | 否 | 品Pai | 吉时利-eithley |
| 型号 | 590 | 测量范围 | 吉时利-eithley 590 |
| 测量精度 | 吉时利-eithley 590 | 分辨率 | 吉时利-eithley 590 |
| 电源电压 | 吉时利-eithley 590 | 用途 | 吉时利-eithley 590 |
产品名称：CV Analyzer产品型号：吉时利590厂商名称：吉时利-Keithley产品简述：CV AnalyzerThe Keithley Model 590 CV Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the Model 590 has been tailored to the requirements of semiconductor device testing.High frequency (100kHz or 1MHz) CV measurements are commonly applied to test p-n or schottky junction and Metal-Insulator-Semiconductor (MIS) devices for device characterization and process control. CV results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.Keithley 590 Features:0.1fF sensitivity to test small devicesRanges up to 20nF (at 100kHz, using the Model 5904 adapter) to test large, leaky, or forward biased devicesTest signal voltage of 15mV rmsChoice of 1MHz frequency for compliance with existing test standards or 100kHz for improved resolution, range, and accuracySelectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-ofSophisticated correction for transmission line errors due to device connectionsBuilt-in test setup and correction value storage, analysis, and plotter control to minimize computer programming100kHz, 1MHz, or 100kHz/1MHz test frequenciesMeasures capacitance (10fF-20nF) and conductance (0.1nS-1µS)Internal correction for errors due to cables, connections, and switching pathsBuilt-in test setup and correction value storage, analysis, and plotter control to minimize computer programming
