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MarSurf CD 140 / 280 Contour measuring station、MarSurf CD 140 / 280 Contour measuring station、MarSurf CD 140 / 280 Contour measuring station
Contour measuring in a new dimension
The new MarSurf CD series from Mahr sets new standards when it comes to contour testing. With the new MarSurf CD series, manufacturing companies are entering a new dimension in order to reliably secure and improve the manufacturing quality of workpieces in the measuring room or close to production.
The new measuring station concept combines speed, safety and flexibility. The aim is to increase the profitability of the system for your company.
Innovative Technologies:
Fast axes
- Positioning Speeds up to 200 mm/s in X
- 25x faster than the predecessors MarSurf PCV and MarSurf CD 120
- All measuring stations of this series have a fully CNC-capable Z-axis
- The Z-axis is approx. twice as fast as previous Mahr Z-axes
- Up to 5x faster than the X-axes usually found on the market
Highly dynamic, inligent probe system
- Probe arm recognition via integrated chip
- Standard measuring range up to 70 mm; max. 100 mm with 490 mm probe arms
- Magnetic probe arm mount, probe arm change without tools
- The probe system combines robustness with dynamics
- Optional: Expansion for roughness Evaluation
Innovative workpiece clamping system
- Mounting plate 390 x 430 mm with bore size 50 mm
- Integrated 60 mm TY adjustment
- The combination of mounting plate and integrated TY adjustment omits the needs for an additional XY table
- Low workpiece set-up leads to an advantageously short measuring circuit, which positively affects the measuring results
| 6269004 - MarSurf CD 280 BG 11 | 6269000 - MarSurf CD 140 BG 11 |
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测杆长度 | 210 mm; 350 mm; 490 mm | 210 mm; 350 mm; 490 mm |
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测量速度(文本) | 0.1-10 mm/s | 0.1-10 mm/s |
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扫描长度末尾(X 方向) | 280 mm | 140 mm |
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分辨率 | max. 6 nm (with 210 mm probe arm) | max. 6 nm (with 210 mm probe arm) |
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扫描长度开始(X 方向) | 0.1 mm | 0.1 mm |
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定位速度(文本) | 0.1-200mm/s | 0.1-200mm/s |
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导块偏差 | 0,125 µm / 60 mm 0,3 µm / 140 mm 0,45 µm / 280 mm | 0,125 µm / 60 mm
0,3 µm / 140 mm |
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测量范围 mm | 70 mm (in Z with 350 mm probe arm)
max. 100 mm (with 490 mm probe arm) | 70 mm (in Z with 350 mm probe arm)
max. 100 mm (with 490 mm probe arm) |
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测量力 (N) | 4 mN to 30 mN, in Z+ and Z-, adjustable via software | 4 mN to 30 mN, in Z+ and Z-, adjustable via software |
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