多功能扫描探针显微镜

Measurement modes:

Motion patterns at the measurements:
- area (matrix); 
- line; 
- single point.

1. Contact static AFM
2. Lateral force microscopy /with contact static AFM/
3. Non-contact dynamic AFM
4. Intermittent contact AFM (similar to Tapping Mode®)
5. Phase contrast imaging /with intermittent contact AFM/
6. Two-pass mode (for static and dynamic AFM)
7. Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/
8. Multicycle scanning (for static and dynamic AFM) /Original technique!/
9. Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/
10. Electrostatic force microscopy (two-pass technique) *, **
11. Current mode *, **
12. Magnetic force microscopy (two-pass technique) *, **
13. Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)
14. Dynamic force spectroscopy
15. Dynamic frequency force spectroscopy /Original technique!/
16. Nanoindentation *
17. Nanoscratching *
18. Linear nanowear *
19. Nanolithography (with control of load, depth and bias voltage) *
20. Microtribometry * /Original technique!/
21. Microadhesiometry * /Original technique!/
22. Shear-force microtribometry * /Original technique!/
23. Temperature-dependent measurements (under all above modes) *

Note. 
* - Specialized accessories or rig required
** - Specialized probes required

Scan field area:

from 5x5 micron up to 50x40 microns

Maximum range of measured heights:

from 2 to 4 micron

Lateral resolution (plane XY):

1–5 nm (depending on sample hardness)

Vertical resolution (direction Z):

0.1–0.5 nm (depending on sample hardness)

Scanning matrix:

Up to 1024x1024 points

Scan rate:

40–250 points per second in X-Y plane

Nonlinearity correction :

A software nonlinearity correction provided

Minimum scanning step:

0.3 nm

Scanning scheme:

The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe.

Scanner type:

A piezoceramic tube.

Cantilevers (probes):

Commercial AFM cantilevers of 3.4x1.6x0.4 mm. 
Recommended are probes from Mikromasch or NT-MDT. Checked for operation with probes by BudgetSensor and Nanosensors

Cantilever deflection detection system:

Laser beam scheme with four-quadrant position-sensitive photodetector

Sample size:

Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm

High voltage amplifier output:

+190 V

ADC:

16 bit

Operation environment:

Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70%

Range of automated movement of measuring head:

10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring

Overall dimensions:

Scanning unit: 185x185x290 mm
Control electronic unit: 195x470x210 mm

Field of view of embedded videosystem:

1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps.

Vibration isolation:

Additional antivibration table is recommended

Host computer:

Not less than: Celeron^® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows^® XP SP1, 2 USB port.
Recommended:  Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows^® XP SP2 or higher, 2 free USB port.

Software:

Special control software SurfaceScan and the AFM image processing package SurfaceView / SurfaceXplorer are included.