Measuring Group Delay of Frequency Converters with Embedded LO |
Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note |
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 This application note discusses the unique challenges involved in minimizing noise figure. |
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy. |
Application of Keysight's PNA-X NVNA and X-Parameters in Power Amplifier Design This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Keysight's solutions. |
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion. |
High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19 This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA). |
Total Analysis Environment for Modeling Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling. |
Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22) This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model. |